The XGT systems can flexibly adapt to a wide range of sample sizes, from the analysis of a 10 µm spot, to mapped analysis of areas up to 10 cm x 10 cm. As a result, a wide variety of samples can be analyzed, from a 10 µm feature on a microchip to the analysis of an entire archaeological relic. Options for extended sample chambers ensure even the largest of samples can be accommodated. |
XGT-5000 micro-XRF analyzer with Extra Large Sample Chamber |
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micro |
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macro |
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10 µm: Analysis of a Lead-Free
Solder Circuit board
Minute areas on circuit boards can be examined and analyzed on the micro-scale.
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information
1 cm: Analysis of a Foreign
Substance in a tablet
Easy, direct analysis of a visible foreign object within a tablet.
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information
10 cm: Analysis of museum manuscript
Non-destructive analysis of a large image in a historical document
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information


