In
just 30s the XGT-1000WR will give an accurate analysis
of the WEEE/RoHS/ELV restricted elements (lead, cadmium,
mercury, chromium and bromide) to within consent limits.
Main Features
- Fast and easy operation
- 1.2mm beam for accurate analysis of even small parts and components
- Automated data analysis with pass/fail result
- Fast data storage
Application Areas
- WEEE/RoHS/ELV
- Quantitative analysis of harmful elements
- Solders
- Electronics and components
- Metals
- Glass
- Plastics
A simple 3 step process:
1. Put in the sample
|
2. Using the CCD camera, specify the area to be tested
|
3. Press the button
|
After 30s:
|
Simply
place the sample directly into the sample chamber.
The irradiation diameter is 1.2mm, so even small parts
can be measured as is. The XGT series makes it easy
for anyone.
The
area to be tested can be specified easily, even for
parts with multiple plastic sections, by observing
the sample using the 50x CCD camera.
Just
press the button to perform the analysis automatically.
The analysis results are displayed quickly and accurately.New Option for Liquid Nitrogen Free Cooling - the XGT-1100WR
The new liquid nitrogen free detector system of the XGT-1100WR offers the same high sensitivity HORIBA patented 'Xerophy' silicon detector used in the XGT-1000WR system, but without the inconvenience associated with liquid nitrogen cooling. The novel detector unit still cools to the ultra low noise temperature of 77K, and hence it ensures that ground breaking performance is now available with maximum convenience.
Added versatility with the XGT-5000WR
WEEE/RoHS/ELV
elemental analysis with full sample mapping capability.
Click
here for further information.
