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Location: News >> Current Press Releases

 August 2007

• 2007 Masao Horiba Award Winners Announced
• Extending UVISEL Performance until the VUV down to 140 nm
• Innovative Instrument for Fluorescence Dynamics Wins R &D 100 Award

July 2007

• New SPRi line at HORIBA Jobin Yvon
• Petroleum products analysis with a radially viewed, CCD based ICP-AES instrument
• S in oil with ASTM D-4294 and ISO 8754
• S and N with ASTM D-5453, ASTM D-4629 and ISO 20846
• Portable S in oil with ASTM D-4294 and ISO 8754

 May 2007

• OEM electronics for Hamamatsu & E2V CCDs

 March 2007

• Try out a Spectroscopic Ellipsometer today and find out what it can do for your research
• Multichannel Detectors for every Occasion
• ACTIVA-M Wins Editors' Best New Product Bronze Award at Pittcon 2007
• XGT1700 WR and XGT-5700 WR EDXRF Imaging Microscope
• FluorEssence Software for FluoroLog or FluoroMax
• OEM Miniature Raman Components and Systems
• MultiFrequency Fluorometry
• CLUE: Spectroscopic Accressory for SEMs
• ACTIVA-M, the Master in True Multi-line Analysis

 February 2007

• Upgraded Version Of Partica LA-950 Particle Size Analyzer

January 2007

• Slurry Sampler For Automated Particle Size Analysis

 November 2006

• LabSpec 5 (LS5), the complete software solution for Raman
• Application Notes for Carbon & Sulfur Analysis: Copper and Ferrosilicon

 October 2006

• Free Poster Illustrating How an ICP System Works
• New FluoroMax^®-4 Bench-top Spectrofluorometer
• A New Award for the Custom Gratings Production Team from NASA Jet Propulsion Lab
• Introduction of M.A.S.T.E.R. and S.O.S. Interactive Tools for ICP-OES

 August 2006

• New 265 nm NanoLED Source Emits Nanosecond Pulses in the Deep UV

July 2006

• HORIBA Jobin Yvon announces its 3^rd Glow Discharge Day
• Small Volume Accessory for LA-950 Particle Size Analyzer

June 2006

• MM-16: Fast and Low Cost Spectroscopic Ellipsometer and Polarimeter
• DigiScreen: Fast Large Area Film Thickness Uniformity Measured by Spectroscopic Reflectometry
• UVISEL VIP: Spectroscopic Ellipsometer combined with Micro Spot Reflectometer for Patterned and Multilayer Samples Characterization
• NEW from HORIBA Jobin Yvon: Audio-visual tutorials: "What is Fluorescence" A Must for Fluorescence Users or Students of Molecular Spectroscopy
• LEM Series: Versatile Laser Interferometric Camera and Endpoint Detector

May 2006

• Modular Raman Spectrometers

March 2006

• Sub Micron Analysis - Raman/AFM Hybrid Raman Technology

 January 2006

• Ultra Pure Wavelength Tunable Light Source
• HORIBA Jobin Yvon offers fluorescence lifetimes on a microscope
• Synapse USB 2.0 CCD Detector
• Spectroscopic Ellipsometer: Did you measure all of the Data?
• Spectral Dimensions® and HORIBA Jobin Yvon
• Integrated Spectroscopy Modules
• iHR550 Imaging Spectrometer
• New XRF microscope provides ground breaking 10 m analysis
• Pittcon Announces 2006 Award Recipients
• New Glow Discharge Spectrometer for Rapid Depth Profiling
• Simultaneous Carbon & Sulfur Analyzers
• New Spectra Database Improves ICP Accuracy
• Laser Ablation and the ULTIMA 2 ICP

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