This
new GD-PROFILERT system features an Ultra Fast Acquisition
Module allowing the measurement of layers less than 1 nm
in thickness. In addition, it features the TimePlus function
- an automatic extension of the measurement during surface
analysis if the pre-selected time is too short.
GD-PROFILERT now also features an RF system that can operate in a pulse mode as well as the standard mode, offering major improvements for thin and fragile samples (glasses, polymers etc).
Sample holders are now available to allow the analysis of tubes, round or odd sample geometries. Also a combination of anode diameters from 1 to 7 mm is now available.
Finally, the GD-PROFILERT is equipped with new QuantumT XP which offers several unique features including databases for sputtering rates, molecular and line spectra, patented 3D results display and the new layer mode for the ultimate precision in the calibration for surface and depth profile analysis.
For further information about this press release, you can send an e-mail request by .
